Physicists in Leiden have developed a microscope that can assess four important features of a material in a single scan, all ...

Physicists in Leiden have built a microscope that can measure no fewer than four key properties of a material in a single scan, all with nanoscale precision. The instrument can even examine complete ...

The following sections cover the basic concepts and technologies that underpin the construction and operation of an atomic force microscope. An atomic force microscope is optimized for measuring ...

Figure 1: An example of the use of the mmTIRFM in a CoSMoS experiment to study spliceosome assembly. Multiwavelength TIRFM often uses an objective-based setup in which TIR is generated by focusing the ...

This article serves as a basic introduction to the design and operation of an atomic force microscope. The following sections cover the basic concepts and technologies that help understand the ...

Accurate measurement results depend on regular microscope calibration to ensure consistency and reliability across scientific and industrial use.

The PureFocus850 from Prior Scientific enhances the functionality of existing microscope systems by automatically recovering and maintaining focus during sample imaging Focus on versatility the ...

Engineers have developed a small, mirrored chip that helps to produce dark-field images, without dedicated expensive components. The chip is slightly larger than a postage stamp and as thin as a ...