Automatic test pattern generation automatic test pattern generator is an electronic design automation method used to find an input sequence that, when applied to a digital circuit, enables automatic ...

Testing digital designs usually requires one or more digital signals, some of which can be very difficult to generate. Pattern generators are specifically designed to address this problem. Whatever ...

CRTs don’t last forever, and neither do the electronics that drive them. When you have a screen starting to go wonky, then you need a way to troubleshoot which is at fault. A great tool for that is a ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

Mountain View, Calif.—Synopsys Inc. announced availability of its TetraMAX small delay defect automatic test pattern generator (ATPG) for use by design organizations worldwide to improve the quality ...

SANTA CLARA, Calif. — Advantest Corp. announced it was collaborating with Synopsys Inc. to develop a fast, accurate failure-diagnostics system for deep-submicron system-on-chip (SoC) designs. The ...