In the early time of optical design, people have to be proficient in aberration theory and perform a huge amount of numerical calculations, and thus mathematical skills and talents are very important.

As the scaling of silicon technology proceeds, via resistance is becoming a dominant factor in integrated circuit (IC) yield, performance, and reliability. At advanced nodes, interconnects and via ...

A new technical paper titled “CROP: Circuit Retrieval and Optimization with Parameter Guidance using LLMs” was published by researchers at Duke University and Synopsys. “Modern very large-scale ...